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Tina Sebastian: 539.216.2:537.311.1(043.2) TIN: Instrumentation: Currell, Graham: 54.08 CUR : Environmental analysis: Reeve, Roger N: 54:502 REE: Sample pretreatment and seperation
R.Jayakrishnan, Tina Sebastian, C.Sudha Kartha and K.P.Vijayakumar, Proceedings of National Conference on Luminescence Application (NCLA), 2005,Vol XVII, p.130 Defect studies on SEL ...
... jithin raj g r 214 207221412330 vinayak k 215 207221511066 deepthi m 216 207221611507 jithin chandran 217 207221711502 archana narayana 218 207221812320 tina sebastian 219 207221912435 sreerag s r ...
... and A. Rajadurai Measurement of thermal and electronic transport properties of semiconductor thin films using photo thermal deflection technique Anita R. Warrier, Tina Sebastian, K. P ...
Wilson, KC; Tina Sebastian; Teny Theresa John; Sudha Kartha, C; Vijayakumar, Appl. Phys. Lett., 2006, Vol.89 , pp.013510. Implications of Mn site hyperfine fields on CMR ...
Tina Sebastian: 539.216.2:537.311.1(043.2) TIN: Instrumentation: Currell, Graham: 54.08 CUR : Environmental analysis: Reeve, Roger N: 54:502 REE: Sample pretreatment and seperation
... Rajadurai Measurement of thermal and electronic transport properties of semiconductor thin films using photo thermal deflection technique Anita R. Warrier, Tina Sebastian, K ...
... jithin raj g r 214 207221412330 vinayak k 215 207221511066 deepthi m 216 207221611507 jithin chandran 217 207221711502 archana narayana 218 207221812320 tina sebastian 219 207221912435 ...
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